X-ray Fluorescence Spectrometer FM-XRF-A100 rapidly examines atomic composition of samples within 30 to 200 s. Employs energy dispersion mechanism to measure wide range of elements starting from Sodium (11) to Uranium (92). Features programmable gain control, digital multichannel analyzer and electric refrigeration FAST-SDD detection. Equipped with multi-million pixels HD camera and advanced software for digital documentation. Our XRF Spectrometer has wide spectrum applications in research and industrial analysis.
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| Instrument Host | 1 piece |
| Computer | 1 piece |
| Laser Printer | 1 piece |
| Analysis Software | 1 set |
| Vacuum System | 1 set |
| Portable Vacuum Cleaner | 1 piece |
| Manual Tablet Press | 1 piece |
| Regulated Power Supply | 1 piece |
| Reference Materials | 1 set |
| S Standards | 1 set |
| Analytical Method | Energy-dispersive X-ray Fluorescence |
| Element Measuring Range | Atomic Number From 11 To 92 [Sodium (Na) To Uranium (U)] |
| Analytical Range | ppm to 99.99% |
| Analysis Time | 30 to 200 s |
| Analysis Accuracy | RSD ≤ 0.1 % |
| Energy Resolution | 100 eV |
| X-Ray Tube Current | 5 µA to 1000 µA |
| X-Ray Tube Voltage | 5 KV to 50 KV |
| Vacuum Rate | 10-2 pa in 10 s |
| Vacuum Pump Power Consumption | 550 W |
| Detector Type | Electric refrigeration FAST-SDD semiconductor |
| Detector Photon Counting Rate | 500000 CPS |
| Detector Signal to Noise Ratio | 6500 is to 1 |
| Analyzer Type | 2048 channelled digital multichannel analyzer |
| Modes Of Operation | 2, Linear and pulse |
| Pulse Mode Type | Triangular pulse shaping |
| Pulse Forming Time | 2 μs |
| Spin System Speed | 4 r/s |
| Spin System Current | 1.5 A |
| Spin System Voltage | 24 V |
| Camera System | 500 million pixels High-definition camera |
| Ambient Humidity | 30% – 80% |
| Sample Chamber Size | 170 × 39 mm |
| Power Consumption | 100 W |
| Power Supply | AC 220V ±10%, 50Hz |
| Dimension (W × D × H) | 700 × 650 × 800 mm |
| Weight | 80 kg |
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